JEM America has been specializing in Cantilever probe cards
for memory and logic devices for over 20 years. Cantilever probe
card is a robust, cost-effective probing solution for applications
such as high parallelism, fine pitch, parametric testing, etc.
The quality of our cantilever probe card has excellent reputation
in the industry. One of the contributing factors is the quality
of our probe card design. Our designers conduct probe spacing
and gram force analysis as well as simulation of probe card
warpage due to high temperature and high probe force in order
to achieve optimized probe geometries. These analyses are imperative
in ensuring uniform probe force, contact resistance and scrub
By implementing automatic documentation and standardizing
manufacturing processes, JEM America has the capability to
offer quick turnaround to our customers. We keep a wide variety
of generic PCBs for the most current tester platforms in stock.
To further enhance our quick-turn capability, we equipped
our manufacturing facility with in-house laser machine to
make custom ceramic contoured ring and other fixtures for
individual devices quickly.
JEM's Cantilever Probe Card consists of four main components:
Probe/Sensor, Ring, Epoxy, and PCB. The probe card structure
is shown in the figure below. For more details, please refer
to the Cantilever Probe Card Basics. If you are interested
in learning our specifications, please contact your JEM sales
representative or JEM America directly.