With the rapidly increasing usage of image sensors in
camera-equipped cellular phones and digital cameras, JEM has
developed the VE-Series Probe Cards for high parallelism
testing of image sensor devices. VE-Series is a hybrid of
cantilever and vertical probing technologies featuring enhanced
signal integrity by reduced probe length (approx. 2.5mm).
With multi-site parallel testing capability, the VE-Series probe
card is an advanced yet cost-effective solution image testing
solution with reduced test time and high throughput.
The VE-Series probe cards are specially designed to
accommodate illuminator system (light source) for image
sensors. They work with various image sensor tester
systems (e.g. Teradyne IP750EP).